EA8000A for the rapid analysis of metal particles in lithium-ion battery separators

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Conventional X-ray computerized tomography (CT) systems require about 10 hours to detect metal particles 20 μm in diameter in battery electrode plates and separators 250 × 200 mm in size. Hitachi High-Tech have developed a new particle inspection technology that can detect and analyze metal contaminants in just 3 to 10 minutes, greatly increasing testing throughput.

While other techniques often only identify small particles when they’re on the
surface of the sample, Hitachi’s analyzer uses unique, focused X-ray optics to
locate and identify the elements in metal particles deeper within electrode plates,
separators and organic films.
Sample preparation is fast and easy: operators simply place a sample in the
analyzer’s sample stage, and carry out the analysis. For a comprehensive
analysis, the EA8000A measurement stages are:

1. Obtain an optical image of the surface using transmitted X-rays
2. Auto-detect the position of any contaminants using image processing
3. Morphological observation and automated image capture of contaminated
areas
4. Elemental mapping of the contaminated areas by X-ray fluorescence
5. Report creation

These steps can be fully automated, freeing the operator for other tasks, and optimizing productivity.

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